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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Inventory # A-13912

SKU: 67897705776

4.8
USD437.00 USD479.00

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Ships within 48 hours · Estimated delivery Jul 26 - Jul 31

Description

Inventory # A-13912

Model No: Type 683 This MKS Instruments 683B-26787 Control Valve Type 683 Working Surplus is used working surplus

This UNIT Instruments 1100-100039 is used working surplus

Model No: H628 WTR V1

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Inventory # A-13912JEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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