Pay in 4 interest-free payments of $100.65 Learn more
Ships within 48 hours · Estimated delivery Jul 25 - Jul 30
REPAIR KIT 25MM 3WY T-PORT VLV
Part No: 0020-31609
Part No: 4K957-144
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL BP102002-00 BCD-BIN/SW PB Board PCB is used working surplus
TEL Tokyo Electron 5004-200011-12 Under Cup Rudolph Technologies F30 New Surplus REPAIR KIT 25MM 3WY T-PORTTEL Tokyo Electron 5004 200011 12 Under Cup Rudolph Technologies F30 New Surplus Part No: 5004 200011 12 SS5004 200011 12 CUP, UNDER For use with a Rudolph Technologies F30 300mm Wafer Mounter & Defect Inspection System Made in Japan This is new surplus. The physical condition is great. Sale Details Item Condition: New, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 15 lbs. Shipping Terms: All Domestic and
US$ 34.00
US$ 38.00
US$ 33.00
US$ 21.00
US$ 20.00
US$ 85.90
US$ 39.88